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Test Interfaces for Power Systems


The Long Test Switch (LTS) is designed to safely disconnect IED's from the system and provide test access. Usable as a retrofit to FT switches in the same cutout size, or in any other application calling for test switches, the LTS provides many benefits.

Contact opening and safe make-before-break CT-shorting are achieved via integrated disconnect pins. Banana jacks provide test access. Separate test plugs are not needed, but available as an option. This translates into cost savings, prevention of errors, and very flexible usage.