The seminar provides an overview of the evolution of test interfaces alongside the development

of protection systems, highlighting the increasing significance of IEC 61850 standards, digital

substations, and the emergence of innovative test interfaces.

It begins by establishing the context of grid evolution and the disruption occurring within

protection systems due to factors like increased grid complexity, renewable integration, and

smart grid technologies. The discussion covers traditional protection systems, their historical

development, and the functions of traditional test interfaces, including isolation, test signal

injection, measurement, and safety considerations.

The seminar then addresses the challenges modern grids pose, emphasizing the necessity for

dynamic and adaptable protection systems and the integration of digital technologies. Emerging

technologies like Merging Units and LPITs in digital substations are explored, along with their

implications for test interfaces. The role of test interfaces in complying with IEC 61850 within

digital substations is examined, focusing on low-power switches as the next generation of test

interface technology and the shift towards PCB-based solutions and low-voltage signals.

The seminar concludes by summarizing key concepts and discussing future trends in protection

systems and test interfaces, emphasizing the growing importance of digital technologies,

communication protocols, and standardization.